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http://krishi.icar.gov.in/jspui/handle/123456789/4914| Title: | Robustness of complete diallel crossing plans against exchange of one cross |
| Other Titles: | Not Available |
| Authors: | D.K. Panda Rajender Parsad V.K. Sharma |
| Published/ Complete Date: | 2003 |
| Project Code: | Not Available |
| Keywords: | Complete Diallel Crossing Plans Exchange of a Treatment Robustness Variance balanced gca effects |
| Publisher: | Taylor & Francis |
| Citation: | Panda, D.K., Parsad, Rajender and Sharma, V.K. (2003). Robustness of complete diallel crossing plans against exchange of one cross. Journal of Applied Statistics, 30(1), 21-35. |
| Series/Report no.: | Not Available; |
| Abstract/Description: | The robustness aspects of block designs for complete diallel crossing plans against the exchange of one cross using connectedness and efficiency criteria have been investigated. The exchanged cross may have either no line in common or one line in common with the original cross. It has been found that randomized complete block (RCB) designs for complete diallel crosses and binary balanced block designs for complete diallel crosses are robust against the exchange of one cross in one observation. The RCB designs for diallel crosses have been shown to be robust against the exchange of one cross with another cross in all the blocks. The non-binary balanced block designs obtainable from Family 5 of Das et al. (1998) have also been found to be robust against the exchange of one cross. |
| Description: | Not Available |
| ISSN: | Not Available |
| Type(s) of content: | Research Paper |
| Sponsors: | Not Available |
| Language: | English |
| Name of Journal: | Journal of Applied Statistics |
| NAAS Rating: | 7.03 |
| Volume No.: | 30(1) |
| Page Number: | 21-35 |
| Name of the Division/Regional Station: | Not Available |
| Source, DOI or any other URL: | http://dx.doi.org/10.1080/0266476022000018484 http://www.tandfonline.com/doi/pdf/10.1080/0266476022000018484 |
| URI: | http://krishi.icar.gov.in/jspui/handle/123456789/4914 |
| Appears in Collections: | AEdu-IASRI-Publication |
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