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ICAR RESEARCH DATA REPOSITORY FOR KNOWLEDGE MANAGEMENT
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Published/ Complete Date | Title | Author(s)/ PI/CoPI |
---|---|---|
25-Apr-2020 | Biplot analysis for spot blotch and yield trait using wami panel of spring wheat | Ram Narayan Ahirwar; Vinod Kumar Mishra; Dwijesh Chandra Mishra; Neeraj Budhlakoti; Shweta Singh; Ramesh Chand |
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