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Field | Value |
Title | Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films (vol 233, pg 297, 2004) |
Names |
VASA, P
(author) SINGH, BP (author) TANEJA, P (author) AYYUB, P (author) |
Date Issued | 2004 (iso8601) |
Genre | Correction |
Topic | antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films (vol 233, pg 297, 2004) |
Identifier | 0030-4018 |
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