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| Field | Value |
| Title | Effect of stress in copper ferrite thin films |
| Names |
AHMAD, M
(author) DESAI, M (author) |
| Date Issued | 2008 (iso8601) |
| Abstract | Cubic copper ferrite thin films, obtained by rf sputtering on quartz and subsequent post-annealing and quenching, show a large coercivity of about 300-600 Oe. Stress measurements using X-ray diffraction show high value of stress of about 400-1000 MPa. Both the stress and coercivity are found to increase with the decrease of the thickness of the films. There appears to be a contribution of the stress to the coercivity of the films, in the in-plane M-H loops. (c) 2008 Elsevier B.V. All rights reserved. |
| Genre | Letter |
| Topic | stress |
| Identifier | 0304-8853 |
| Related Item | |