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Field | Value |
Title | X-ray photoelectron spectroscopic studies of the valence state of tl in single-tl-o-layered tlba1-xsrxlacuo5 (0-less-than-or-equal-to-x-less-than-or-equal-to-1) |
Names |
SUNDARESAN, A
(author) GOPINATH, CS (author) TAMHANE, AS (author) RAJARAJAN, AK (author) SHARON, M (author) SUBRAMANIAN, S (author) PINTO, R (author) GUPTA, LC (author) VIJAYARAGHAVAN, R (author) |
Date Issued | 1992 (iso8601) |
Abstract | The valence state of thallium in TlBa1-xSrxLaCuO5 (x = 0.0, 0.4, 0.7, and 1.0) has been investigated by measuring Tl 4f core levels by x-ray photoelectron spectroscopy. It is shown that the valence state of Tl in TlBaLaCuO5 (nonsuperconducting) is 3+, whereas that in TlSrLaCuO5 (superconducting, T(c) = 32 K) is between 3+ and 1+. The origin of holes in the latter compound is discussed in terms of charge transfer between Tl ions and Cu-O layers as has been found in double-Tl-O-layered compounds. |
Genre | Note |
Topic | copper-oxide superconductors |
Identifier | 0163-1829 |
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