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Field | Value |
Title | Flux-creep in YBA2CU3O7-Y thin-films induced by self-field of the transport current |
Names |
KUMAR, R
(author) MALIK, SK (author) PINTO, R (author) VIJAYARAGHAVAN, R (author) KUMAR, D (author) |
Date Issued | 1993 (iso8601) |
Abstract | Self-field induced flux creep has been studied in YBa2Cu3O7-y thin films in zero external field at temperatures below T(c). Self-field induced flux creep model, which is the extension of Anderson and Kim conventional flux creep model has been introduced. The verification of the model has been done by performing voltage-current measurements on patterned YBa2Cu3O7-y thin films. The variation of pinning potential, U0, as function of temperature is obtained. |
Genre | Article; Proceedings Paper |
Topic | cu-o crystal |
Identifier | 0964-1807 |
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