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Investigations of nano size defects in InP induced by swift iron ions

DSpace at IIT Bombay

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Title Investigations of nano size defects in InP induced by swift iron ions
 
Creator DUBEY, RL
DUBEY, SK
YADAV, AD
GUPTA, SJ
PANDEY, SD
RAO, TKG
MOHANTY, T
KANJILAL, D
 
Subject x-ray-diffraction
damage formation
crystalline inp
irradiation
gaas
swift heavy ion irradiation
fe ions
inp
afm
high resolution x-ray diffraction
 
Description Indium phosphide (InP) samples were irradiated with swift (100 MeV) Fe-56(7+) ions with different fluences varying from 5 x 10(12) to 2 x 10(14) cm(-2) at room temperature. Atomic force microscopy (AFM) and high resolution X-ray diffraction (HRXRD) have been used to investigate the irradiation effects. AFM observations revealed the presence of nanosized defect clusters in all irradiated InP samples. Size (diameter) and density of defect clusters was found as a function of ion fluence. Root mean square (r.m.s) surface roughnesses measured using the Nanoscope software supplied with the AFM instrument were found to change from 0.33 nm to 7.49 nm. HRXRD studies revealed the presence of radiation-damaged layer (strained peak) in high fluence (2 x 10(14) cm(-2)) Fe ion irradiated InP. The screw dislocations, out of plane strain and lattice mismatch of irradiated samples have been studied. (c) 2007 Elsevier B.V. All rights reserved.
 
Publisher ELSEVIER SCIENCE BV
 
Date 2011-10-23T01:40:44Z
2011-12-15T09:10:59Z
2011-10-23T01:40:44Z
2011-12-15T09:10:59Z
2007
 
Type Article; Proceedings Paper
 
Identifier NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,257,287-292
0168-583X
http://dx.doi.org/10.1016/j.nimb.2007.01.093
http://dspace.library.iitb.ac.in/xmlui/handle/10054/15017
http://hdl.handle.net/100/1776
 
Source 15th International Conference on Ion Beam Modification of Materials,Taormina, ITALY,SEP 18-22, 2006
 
Language English