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Breakdown voltage and on resistance of super-junction power MOSFET : CoolMOS (TM)

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Title Breakdown voltage and on resistance of super-junction power MOSFET : CoolMOS (TM)
 
Creator KONDEKAR, PN
PATIL, MB
PARIKH, CD
 
Description In this paper the concept of the new technology power MOSFETs called CoolMOS((TM)) is analyzed based on Superjunction Theory. The conventional Power MOSFET drift layer is designed first and simulated for comparing with SJ-layer technology. The results of simulation are helpful in explaining, how this new technology has overcome the limitation for high voltage power MOSFETs by breaking the Silicon Limit.
 
Publisher SPIE-INT SOC OPTICAL ENGINEERING
 
Date 2011-10-23T22:51:11Z
2011-12-15T09:11:16Z
2011-10-23T22:51:11Z
2011-12-15T09:11:16Z
2002
 
Type Proceedings Paper
 
Identifier PROCEEDINGS OF THE ELEVENTH INTERNATIONAL WORKSHOP ON THE PHYSICS OF SEMICONDUCTOR DEVICES, VOL 1 & 2,4746,440-443
0-8194-4500-2
0277-786X
http://dspace.library.iitb.ac.in/xmlui/handle/10054/15258
http://hdl.handle.net/100/1966
 
Source 11th International Workshop on the Physics of Semiconductor Devices,New Delhi, INDIA,DEC 11-15, 2001
 
Language English