ICAR Research Data Repository for Knowledge Management
Au nanocrystal flash memory reliability and failure analysis
DSpace at IIT Bombay
View Archive Info| Field | Value | |
| Title |
Au nanocrystal flash memory reliability and failure analysis
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| Creator |
SINGH, PK
SINGH, KK HOFMANN, R ARMSTRONG, K KRISHNA, N MAHAPATRA, S |
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| Subject |
fabrication
performance oxide |
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| Description |
In this work we investigate the memory performance and reliability of An nanocrystal memory devices. We analyze the Au NC formation process and fabricate actual test wafers for electrical characterization. With reference to good Pt NC devices, poor performance of Au NC devices is investigated in detail by analytical and electrical methods.
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| Publisher |
IEEE
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| Date |
2011-10-26T02:30:03Z
2011-12-15T09:11:25Z 2011-10-26T02:30:03Z 2011-12-15T09:11:25Z 2008 |
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| Type |
Proceedings Paper
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| Identifier |
IPFA 2008: PROCEEDINGS OF THE 15TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS,214-218
978-1-4244-2039-1 http://dspace.library.iitb.ac.in/xmlui/handle/10054/15883 http://hdl.handle.net/100/2058 |
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| Source |
15th International Symposium on the Physical and Failure Analysis of Integrated Circuits,Singapore, SINGAPORE,JUL 07-11, 2008
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| Language |
English
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