ICAR Research Data Repository for Knowledge Management
Multiple fault testing of logic resources of SRAM-based FPGAs
DSpace at IIT Bombay
View Archive Info| Field | Value | |
| Title |
Multiple fault testing of logic resources of SRAM-based FPGAs
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| Creator |
GOYAL, S
CHOUDHURY, M RAO, SSSP KUMAR, K |
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| Description |
We shall present a simple but useful method which detects all multiple stuck-at faults in the application and configuration inputs of LUTs. A novel method for testing of stuck-at faults at control bits of flip flops has also been proposed. The aim is to integrate testing of LUTs, flip flops and multiplexers which will reduce the number of configurations and hence minimize the testing time.
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| Publisher |
IEEE COMPUTER SOC
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| Date |
2011-10-24T17:58:41Z
2011-12-15T09:11:42Z 2011-10-24T17:58:41Z 2011-12-15T09:11:42Z 2005 |
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| Type |
Proceedings Paper
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| Identifier |
18TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS: POWER AWARE DESIGN OF VLSI SYSTEMS,742-747
0-7695-2264-5 1063-9667 http://dx.doi.org/10.1109/ICVD.2005.122 http://dspace.library.iitb.ac.in/xmlui/handle/10054/15488 http://hdl.handle.net/100/2232 |
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| Source |
18th International Conference on VLSI Design/4th International Conference on Embedded Systems Design,Calcutta, INDIA,JAN 03-07, 2005
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| Language |
English
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