ICAR Research Data Repository for Knowledge Management
Comparison of negative bias temperature instability in HfSiO(N)/TaN and SiO(N)/poly-Si pMOSFETs
DSpace at IIT Bombay
View Archive Info| Field | Value | |
| Title |
Comparison of negative bias temperature instability in HfSiO(N)/TaN and SiO(N)/poly-Si pMOSFETs
|
|
| Creator |
MAHETA, VD
PURAWAT, S GUPTA, G |
|
| Subject |
mosfets
|
|
| Publisher |
IEEE
|
|
| Date |
2011-10-26T03:55:27Z
2011-12-15T09:11:48Z 2011-10-26T03:55:27Z 2011-12-15T09:11:48Z 2007 |
|
| Type |
Proceedings Paper
|
|
| Identifier |
IPFA 2007: PROCEEDINGS OF THE 14TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS,91-95
978-1-4244-1014-9 http://dspace.library.iitb.ac.in/xmlui/handle/10054/15902 http://hdl.handle.net/100/2298 |
|
| Source |
14th International Symposium on the Physical and Failure Analysis of Integrated Circuits,Bangalore, INDIA,JUL 11-13, 2007
|
|
| Language |
English
|
|