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An efficient numerical scheme to determine the pull-in parameters of an electrostatic micro-actuator with contact type nonlinearity

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Title An efficient numerical scheme to determine the pull-in parameters of an electrostatic micro-actuator with contact type nonlinearity
 
Creator JOGLEKAR, MM
PAWASKAR, DN
 
Subject range
behavior
voltage
travel
drive
model
rayleigh-ritz method
pull-in instability
pull-in displacement
pull-in voltage
contact type nonlinearity
pull-in efficacy index (pei)
 
Description In this article, we present an efficient numerical scheme based on the Rayleigh-Ritz method to determine the pull-in parameters of electrostatically actuated microbeams exploiting contact type nonlinearity. A case of an electrostatically actuated cantilevered microbeam is first analyzed using the Rayleigh-Ritz energy technique. The deflection of the microbeam is approximated by a polynomial trial function. The principle of the stationary potential energy leads to a highly nonlinear algebraic equation, which is solved to determine the deflected shape of the microbeam. A novel voltage iteration algorithm is implemented to determine the critical voltage at which the pull-in occurs. The analysis is then extended to the case of cantilever beam making use of the contact type nonlinearity to exhibit an extended travel range. The present case consists of a compression spring getting engaged at the cantilever tip at the critical point where the pull-in occurs. An increase in both travel range and pull-in voltage is observed with the introduction of the compression spring. A performance index is suggested, which combines the gain in the travel range together with the concomitant increase in the pull-in voltage. This index is used to determine the critical bound for the choice of the stiffness of the newly introduced compression member.
 
Publisher AMER SOC MECHANICAL ENGINEERS
 
Date 2011-10-26T00:31:11Z
2011-12-15T09:12:15Z
2011-10-26T00:31:11Z
2011-12-15T09:12:15Z
2008
 
Type Proceedings Paper
 
Identifier INTERNATIONAL MECHANICAL ENGINEERING CONGRESS AND EXPOSITION 2007, VOL 11 PT A AND PT B: MICRO AND NANO SYSTEMS,483-492
978-0-7918-4305-5
http://dspace.library.iitb.ac.in/xmlui/handle/10054/15859
http://hdl.handle.net/100/2550
 
Source ASME International Mechanical Engineering Congress and Exposition,Seattle, WA,NOV 11-15, 2007
 
Language English