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Electron diffraction study of pulsed laser deposited thin films using a YIG target

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Title Electron diffraction study of pulsed laser deposited thin films using a YIG target
 
Creator KUMAR, N
MISRA, DS
PRASAD, S
SAMAJDAR, I
VENKATARAMANI, N
KRISHNAN, R
 
Subject yttrium-iron-garnet
yttrium iron garnet (yig)
pulsed laser deposition (pld)
yfeo3
electron diffraction
x-ray diffraction (xrd)
 
Description Thin films, pulsed laser deposited (PLD) on Si (100) substrates, from yttrium iron garnet (YIG) target were studied using electron diffraction and X-ray diffraction (XRD). The films were deposited at various deposition temperatures (T-S, 873-1123 K) for this study. For another set of films, films were deposited at ambient temperature and annealed ex-situ (T,, 873-1123 K). It was found that both YIG and orthoferrite (YfeO(3)) phases are present in the films deposited at T, of 873-1023 K. While films deposited at a T-S, of 1073-1123 K show pure YIG phase. The films, which were ex-situ annealed have only orthoferrite phase.
 
Publisher AMER CERAMIC SOC
 
Date 2011-10-26T16:12:44Z
2011-12-15T09:12:25Z
2011-10-26T16:12:44Z
2011-12-15T09:12:25Z
2005
 
Type Proceedings Paper
 
Identifier NINTH INTERNATIONAL CONFERENCE ON FERRITES (ICF-9),183-188
1-57498-218-4
http://dspace.library.iitb.ac.in/xmlui/handle/10054/16058
http://hdl.handle.net/100/2650
 
Source 9th International Conference on Ferrites (ICF-9),San Francisco, CA,AUG 22-27, 2004
 
Language English