ICAR Research Data Repository for Knowledge Management
Scanning probe method : a tool to characterise materials
DSpace at IIT Bombay
View Archive Info| Field | Value | |
| Title |
Scanning probe method : a tool to characterise materials
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| Creator |
VENKATARAMANI, N
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| Subject |
ferrite films
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| Description |
A range of scanned probe techniques (SPM) are available today. The SPM's can work under various environments. The Scanning tunneling microscope (STM)has resolved nearest neighbour atoms and the details of individual atoms on a wide variety of surfaces. Similar resolutions have been shown in the atomic force microscopy experiments in recent times. A review of SPM's in vogue today with some details of the important parameters relevant for obtaining the images in an atomic force microscope has been outlined in this tutorial paper.
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| Publisher |
UNIVERSITIES PRESS INDIA LTD
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| Date |
2011-10-27T08:51:54Z
2011-12-15T09:12:27Z 2011-10-27T08:51:54Z 2011-12-15T09:12:27Z 1999 |
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| Type |
Proceedings Paper
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| Identifier |
SOLID STATE PHYSICS, VOL 41, 1998,79-82
81-7371-198-4 http://dspace.library.iitb.ac.in/xmlui/handle/10054/16241 http://hdl.handle.net/100/2676 |
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| Source |
41st DAE Solid State Physics Symposium,KURUKSHETRA, INDIA,DEC 27-31, 1998
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| Language |
English
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