Record Details

Observation of thickness dependent properties in novel multiferroic thin films

DSpace at IIT Bombay

View Archive Info
 
 
Field Value
 
Title Observation of thickness dependent properties in novel multiferroic thin films
 
Creator PRASHANTHI, K
DUTTAGUPTA, SP
PINTO, RICHARD
PALKAR, VR
 
Subject dielectric polarisation
ferroelectric thin films
magnetic anisotropy
pulsed laser deposition
 
Description Multiferroics exhibit simultaneous coexistence of electric and magnetic ordering with coupling between two order parameters. These materials therefore find novel applications like multiple memories apart from MEMS sensors and actuators etc. Here we report the thickness dependent multiferroic properties of Bi0.7Dy0.3FeO3 films grown on Pt/TiO2/SiO2/Si substrate by pulsed laser deposition technique. In these films, magnetic anisotropy is developed non-linearly with the thickness. It is correlated to stress developed during growth process due lattice mismatch, difference in thermal coefficient, internal defects etc. The lattice cell parameter c also changes arbitrarily with the thickness of the film but correlates with stress. The saturation polarization (Ps) values scale with c parameter. The information obtained by this study would be significantly useful in innovative devices planned with this advanced material.
 
Publisher IEEE
 
Date 2009-01-21T06:47:56Z
2011-11-28T07:10:28Z
2011-12-15T09:56:52Z
2009-01-21T06:47:56Z
2011-11-28T07:10:28Z
2011-12-15T09:56:52Z
2007
 
Type Article
 
Identifier Proceedings of the International Workshop on Physics of Semiconductor Devices, Mumbai, India, 16-20 December 2007, 933-935
978-1-4244-1728-5
10.1109/IWPSD.2007.4472679
http://hdl.handle.net/10054/571
http://dspace.library.iitb.ac.in/xmlui/handle/10054/571
 
Language en