Record Details

Neutron induced oxide degradation in MOSFET structures

DSpace at IIT Bombay

View Archive Info
 
 
Field Value
 
Title Neutron induced oxide degradation in MOSFET structures
 
Creator SHARMA, DK
CHANDORKAR, AN
VAIDYA, SJ
 
Subject mis structures
mosfet
gamma-ray effects
neutron flux
 
Description In this paper, we have measured the intensity of gamma radiation accompanying neutrons at different neutron fluences at the irradiation position. MOS samples were subjected to neutron radiation in a swimming pool type of reactor and other samples from the same batch were exposed to an equivalent dose of accompanying gamma radiation using Co60 gamma source. The difference in the damage caused by the neutrons. While executing this approach, major issues considered were, calibration of gamma radiation accompanying neutrons, consideration of energy spectrums of Co60 and accompanying gamma, measurement of thermal and fast neutron flux at the irradiation position of the reactor and measurement of flux at the different power levels.
 
Publisher IEEE
 
Date 2008-12-15T10:29:27Z
2011-11-28T09:15:07Z
2011-12-15T09:58:00Z
2008-12-15T10:29:27Z
2011-11-28T09:15:07Z
2011-12-15T09:58:00Z
2003
 
Type Article
 
Identifier Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits, Singapore, 7-11 July 2003, 151-155
0-7803-7722-2
http://hdl.handle.net/10054/318
http://dspace.library.iitb.ac.in/xmlui/handle/10054/318
 
Language en