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A novel method to obtain 3-port network parameters from 2-port measurements

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Title A novel method to obtain 3-port network parameters from 2-port measurements
 
Creator JHA, ANURANJAN
VASI, J
RUSTAGI, SC
PATIL, MB
 
Subject mosfet
network analysis
semiconductor device measurement
semiconductor device models
two-port networks
 
Description The two-port description of a four-terminal device like a MOSFFT is incomplete. For complete analysis and at higher frequencies, four terminal characteristics have to be obtained. We describe a simple and novel measurement technique to obtain the complete description from two-port measurements on a single test structure. No extra test structures are needed in this procedure. Such measurements are reported for the first time for a MOSFET.
 
Publisher IEEE
 
Date 2008-12-09T06:26:27Z
2011-11-28T01:38:53Z
2011-12-15T09:58:24Z
2008-12-09T06:26:27Z
2011-11-28T01:38:53Z
2011-12-15T09:58:24Z
2004
 
Type Article
 
Identifier Proceedings of the International Conference on Microelectronic Test Structures (V 17), Japan, 22-25 March 2004, 57-62
0-7803-8262-5
http://hdl.handle.net/10054/239
http://dspace.library.iitb.ac.in/xmlui/handle/10054/239
 
Language en