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An on-chip coupling capacitance measurement technique

DSpace at IIT Bombay

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Field Value
 
Title An on-chip coupling capacitance measurement technique
 
Creator NAIR, PA
GUPTA, A
DESAI, MP
 
Subject vlsi circuits
charge coupled device
coupled circuit
spatial variables measurement
 
Description We describe a technique for the accurate measurement of on-chip coupling capacitance using a Charge Based Coupling Capacitance Measurement (CBCCM) Technique. Detailed circuit simulations show that this method can measure sub-femtofarad coupling capacitance values, and can be used to isolate and measure components of device capacitance as well.
 
Publisher IEEE
 
Date 2008-12-19T10:48:06Z
2011-11-27T18:38:24Z
2011-12-15T09:58:38Z
2008-12-19T10:48:06Z
2011-11-27T18:38:24Z
2011-12-15T09:58:38Z
2001
 
Type Article
 
Identifier Proceedings of the Fourteenth International Conference on VLSI Design, Banglore, India, 3-7 January 2001, 495-499
0-7695-0831-6
10.1109/ICVD.2001.902707
http://hdl.handle.net/10054/398
http://dspace.library.iitb.ac.in/xmlui/handle/10054/398
 
Language en