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High perpendicular anisotropy in copper ferrite thin films

DSpace at IIT Bombay

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Field Value
 
Title High perpendicular anisotropy in copper ferrite thin films
 
Creator AHMAD, M
DESAI, M
KHATIRKAR, R
 
Subject magnetic-properties
magnetocrystalline anisotropy
recording media
inplane
 
Description Copper ferrite thin films, radio-frequency sputtered at 200 W, on fused quartz substrates, postannealed at about 800 degrees C and slow cooled, exhibited a tetragonal copper ferrite phase, but with a preferred orientation of mainly a (3 11) or (400) peak. The films show, a perpendicular coercivity of about 3000 Oe or more, almost two times the parallel coercivity. Magnetocrystalline anisotropy is the major cause of the high coercivity observed in these films. The perpendicular anisotropy of these films is attributed to the texture with the hard axis in the film plane as seen by texture measurement.
 
Publisher AMER INST PHYSICS
 
Date 2011-07-15T19:35:23Z
2011-12-26T12:49:38Z
2011-12-27T05:35:08Z
2011-07-15T19:35:23Z
2011-12-26T12:49:38Z
2011-12-27T05:35:08Z
2008
 
Type Article
 
Identifier JOURNAL OF APPLIED PHYSICS, 103(1), -
0021-8979
http://dx.doi.org/10.1063/1.2826752
http://dspace.library.iitb.ac.in/xmlui/handle/10054/4354
http://hdl.handle.net/10054/4354
 
Language en