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STRUCTURAL DEFECTS IN GLOW-DISCHARGE A-SI-C-H INVESTIGATED BY POSITRON-ANNIHILATION SPECTROSCOPY

DSpace at IIT Bombay

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Field Value
 
Title STRUCTURAL DEFECTS IN GLOW-DISCHARGE A-SI-C-H INVESTIGATED BY POSITRON-ANNIHILATION SPECTROSCOPY
 
Creator DUSANE, RO
RAJARSHI, SV
GOYAL, DJ
BHIDE, VG
NAGRAJAN, T
 
Subject hydrogenated amorphous-silicon
lifetime spectroscopy
infrared-absorption
films
alloys
 
Description Glow discharge deposited hydrogenated amorphous silicon carbon alloy films with varying carbon content are studied for structural defects by positron lifetime spectroscopy. Measurements of optical properties like refractive index (n) and band gap (E(g)) which indirectly reflect the varying carbon content in the films have also been made. The increased defect density in these films with increasing carbon content is very clearly indicated by the positron lifetime data. The nature of these defects and their relative concentrations are determined from the positron lifetime and intensity values. Interestingly a continuous transformation from one type of defect to the other with increasing carbon is indicated by these results.
 
Publisher AMER INST PHYSICS
 
Date 2011-07-16T16:08:46Z
2011-12-26T12:49:51Z
2011-12-27T05:35:36Z
2011-07-16T16:08:46Z
2011-12-26T12:49:51Z
2011-12-27T05:35:36Z
1994
 
Type Article
 
Identifier JOURNAL OF APPLIED PHYSICS, 76(1), 242-245
0021-8979
http://dx.doi.org/10.1063/1.357134
http://dspace.library.iitb.ac.in/xmlui/handle/10054/4468
http://hdl.handle.net/10054/4468
 
Language en