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Structural investigation of thin films and multilayers using X-ray scattering

DSpace at IIT Bombay

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Title Structural investigation of thin films and multilayers using X-ray scattering
 
Creator VITTA, S
 
Subject langmuir-blodgett-films
amorphous multilayers
roughness
reflectivity
surfaces
growth
 
Description A non-destructive characterization of the structure in nanostructured thin films and multilayers is an area of significant importance. In this context the grazing incidence X-ray scattering (GIXS) technique has become a powerful tool. In the present paper the various parameters that define the structure in thin films and multialyers are discussed together with their origin. The GIXS theory relevant to determining these parameters is then discussed in brief. The applicability of the GIXS technique to various materials is clearly demonstrated through examples ranging from Pt-BN composite thin films to Ni-Nb/C multilayers to organic multilayers made from Cd-arachidate and Zn-arachidate (metal substituted fatty acid salts). The structural parameters of these thin films and multilayers were determined using GIXS irrespective of their nature inorganic or organic, indicating the suitability of this method for 3-dimensional structural characterization.
 
Publisher CURRENT SCIENCE ASSN
 
Date 2011-07-21T07:37:40Z
2011-12-26T12:51:56Z
2011-12-27T05:38:46Z
2011-07-21T07:37:40Z
2011-12-26T12:51:56Z
2011-12-27T05:38:46Z
2000
 
Type Article
 
Identifier CURRENT SCIENCE, 79(1), 61-69
0011-3891
http://dspace.library.iitb.ac.in/xmlui/handle/10054/5831
http://hdl.handle.net/10054/5831
 
Language en