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Comment on the effects of overlayer thicknesses on the electrical resistivity of polycrystalline Cu/Cr double-layered thin films - Comment

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Title Comment on the effects of overlayer thicknesses on the electrical resistivity of polycrystalline Cu/Cr double-layered thin films - Comment
 
Creator VITTA, S
 
Description The oscillatory behaviour of the electrical resistivity of Cu/Cr double layers where the Cr layer thickness is >7.5 nm has been attributed to the incommensurate-commensurate phase transition in Cr [1]. The present work shows that the resistivity variation is not due to the incommensurate-commensurate phase transition in Cr.
 
Publisher IOP PUBLISHING LTD
 
Date 2011-08-03T14:30:40Z
2011-12-26T12:54:15Z
2011-12-27T05:41:53Z
2011-08-03T14:30:40Z
2011-12-26T12:54:15Z
2011-12-27T05:41:53Z
1996
 
Type Article
 
Identifier JOURNAL OF PHYSICS-CONDENSED MATTER, 8(26), 4857-4859
0953-8984
http://dx.doi.org/10.1088/0953-8984/8/26/018
http://dspace.library.iitb.ac.in/xmlui/handle/10054/9063
http://hdl.handle.net/10054/9063
 
Language en