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Two-stage component test plans for testing the reliability of a series system

DSpace at IIT Bombay

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Title Two-stage component test plans for testing the reliability of a series system
 
Creator VELLAISAMY, P
SANKAR, S
 
Subject series system
reliability test plans
exponential lifetimes
two-stage component test plans
maximum expected cost
optimization problems
feasible solutions
algorithm
prior information
genetic algorithm
 
Description A system reliability is often evaluated by individual tests of components that constitute the system. These component test plans have advantages over complete system based tests in terms of time and cost. In this paper, we consider the series system with 11 components, where the lifetime of the i-th component follows exponential distribution with parameter lambda(i). Assuming test costs for the components are different, we develop an efficient algorithm to design a two-stage component test plan that satisfies the usual probability requirements on the system reliability and in addition minimizes the maximum expected cost.: For the case of prior information in the form of upper bounds on lambda(i)'s, we use the genetic algorithm to solve the associated optimization problems which are otherwise difficult to solve using mathematical programming techniques. The two-stage component test plans are cost effective compared to single-stage plans developed by Rajgopal and Mazumdar. We demonstrate through several numerical examples that our approach has the potential to reduce the overall testing costs significantly. (C) 2002 John Wiley Sons, Inc.
 
Publisher JOHN WILEY & SONS INC
 
Date 2011-08-16T17:01:19Z
2011-12-26T12:55:03Z
2011-12-27T05:43:35Z
2011-08-16T17:01:19Z
2011-12-26T12:55:03Z
2011-12-27T05:43:35Z
2002
 
Type Article
 
Identifier NAVAL RESEARCH LOGISTICS, 49(1), 95-116
0894-069X
http://dx.doi.org/10.1002/nav.1051
http://dspace.library.iitb.ac.in/xmlui/handle/10054/9564
http://hdl.handle.net/10054/9564
 
Language en