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X-ray photoelectron spectroscopic study of the oxide film on an aluminum-tin alloy in 3.5% sodium chloride solution

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Title X-ray photoelectron spectroscopic study of the oxide film on an aluminum-tin alloy in 3.5% sodium chloride solution
 
Creator VENUGOPAL, A
VELUCHAMY, P
SELVAM, P
MINOURA, H
RAJA, VS
 
Subject anodic passive films
point-defect model
electrochemical properties
stainless-steels
activation
behavior
esca
air
xps
fe
activation
aluminum anion vacancies
cathodic protection
cation vacancies
dissolution
films and film formation
point defects
sacrificial anodes
sodium chloride
tin
x-ray photoelectron spectroscopy
 
Description Oxide films on Al and an Al-Sn alloy were analyzed by x-ray photoelectron spectroscopy (XPS) after immersion in 3.5% sodium chloride (NaCl) solution. Results showed Sn exhibited both Sn2+ and Sn4+ oxidation states in the oxide film It was proposed that incorporation of these cations in the film would result in generation of more anionic and cationic vacancies in aluminum oxide (Al2O3), leading to active dissolution of Al.
 
Publisher NATL ASSN CORROSION ENG
 
Date 2011-08-19T02:23:45Z
2011-12-26T12:56:00Z
2011-12-27T05:43:57Z
2011-08-19T02:23:45Z
2011-12-26T12:56:00Z
2011-12-27T05:43:57Z
1997
 
Type Article
 
Identifier CORROSION, 53(10), 808-812
0010-9312
http://dspace.library.iitb.ac.in/xmlui/handle/10054/10195
http://hdl.handle.net/10054/10195
 
Language en