A FAULT MODEL FOR MULTIVALUED NMOS DYNAMIC RANDOM-ACCESS MEMORIES
DSpace at IIT Bombay
View Archive InfoField | Value | |
Title |
A FAULT MODEL FOR MULTIVALUED NMOS DYNAMIC RANDOM-ACCESS MEMORIES
|
|
Creator |
NAIDU, RV
MAHAPATRA, S |
|
Publisher |
PERGAMON-ELSEVIER SCIENCE LTD
|
|
Date |
2011-08-23T06:00:00Z
2011-12-26T12:56:19Z 2011-12-27T05:44:48Z 2011-08-23T06:00:00Z 2011-12-26T12:56:19Z 2011-12-27T05:44:48Z 1989 |
|
Type |
Article
|
|
Identifier |
MICROELECTRONICS AND RELIABILITY, 29(2), 137-143
0026-2714 http://dspace.library.iitb.ac.in/xmlui/handle/10054/10413 http://hdl.handle.net/10054/10413 |
|
Language |
en
|
|