WORST CASE RELIABILITY BOUNDS
DSpace at IIT Bombay
View Archive InfoField | Value | |
Title |
WORST CASE RELIABILITY BOUNDS
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Creator |
GOVINDACHAR, S
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Publisher |
PERGAMON-ELSEVIER SCIENCE LTD
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Date |
2011-08-27T03:38:49Z
2011-12-26T12:57:43Z 2011-12-27T05:44:56Z 2011-08-27T03:38:49Z 2011-12-26T12:57:43Z 2011-12-27T05:44:56Z 1983 |
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Type |
Article
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Identifier |
MICROELECTRONICS AND RELIABILITY, 23(5), 855-856
0026-2714 http://dx.doi.org/10.1016/0026-2714(83)91012-0 http://dspace.library.iitb.ac.in/xmlui/handle/10054/11531 http://hdl.handle.net/10054/11531 |
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Language |
en
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