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Determination of semiconductor resistance under a contact

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Field Value
 
Title Determination of semiconductor resistance under a contact
 
Creator AHMAD, M
SHAH, AP
SHARMA, DK
ROY, NR
ARORA, BM
 
Subject transmission-line model
ohmic contacts
metal resistance
 
Description In this work the expression for end resistance has been modified for the case of finite metal resistance. It has been shown that using this approach the contact resistivity for alloyed contacts can be determined even in case of small transfer length and large contact length. This is contrary to the case where metal resistance is assumed to be zero. The changes required for different probe positions have also been considered. (C) 2002 . .
 
Publisher PERGAMON-ELSEVIER SCIENCE LTD
 
Date 2011-08-24T01:22:29Z
2011-12-26T12:56:41Z
2011-12-27T05:45:45Z
2011-08-24T01:22:29Z
2011-12-26T12:56:41Z
2011-12-27T05:45:45Z
2002
 
Type Article
 
Identifier SOLID-STATE ELECTRONICS, 46(4), 505-512
0038-1101
http://dx.doi.org/10.1016/S0038-1101(01)00286-6
http://dspace.library.iitb.ac.in/xmlui/handle/10054/10713
http://hdl.handle.net/10054/10713
 
Language en