Record Details

FAULT TOLERANCE IN N-MOS RANDOM-ACCESS MEMORIES WITH DYNAMIC REDUNDANCY METHODS

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Field Value
 
Title FAULT TOLERANCE IN N-MOS RANDOM-ACCESS MEMORIES WITH DYNAMIC REDUNDANCY METHODS
 
Creator NAIDU, RV
MAHAPATRA, S
 
Publisher PERGAMON-ELSEVIER SCIENCE LTD
 
Date 2011-08-24T09:37:03Z
2011-12-26T12:56:50Z
2011-12-27T05:46:09Z
2011-08-24T09:37:03Z
2011-12-26T12:56:50Z
2011-12-27T05:46:09Z
1988
 
Type Article
 
Identifier MICROELECTRONICS AND RELIABILITY, 28(2), 193-200
0026-2714
http://dx.doi.org/10.1016/0026-2714(88)90350-2
http://dspace.library.iitb.ac.in/xmlui/handle/10054/10838
http://hdl.handle.net/10054/10838
 
Language en