Record Details

PROFILING GENERATION LIFETIME IN AN MOS CAPACITOR USING A MULTISTEP CONSTANT-CAPACITANCE TECHNIQUE

DSpace at IIT Bombay

View Archive Info
 
 
Field Value
 
Title PROFILING GENERATION LIFETIME IN AN MOS CAPACITOR USING A MULTISTEP CONSTANT-CAPACITANCE TECHNIQUE
 
Creator LAL, R
VASI, J
 
Publisher PERGAMON-ELSEVIER SCIENCE LTD
 
Date 2011-08-26T05:10:04Z
2011-12-26T12:57:17Z
2011-12-27T05:47:20Z
2011-08-26T05:10:04Z
2011-12-26T12:57:17Z
2011-12-27T05:47:20Z
1987
 
Type Article
 
Identifier SOLID-STATE ELECTRONICS, 30(8), 801-805
0038-1101
http://dx.doi.org/10.1016/0038-1101(87)90004-9
http://dspace.library.iitb.ac.in/xmlui/handle/10054/11202
http://hdl.handle.net/10054/11202
 
Language en