Record Details

Relaxation of operational amplifier parameters after pulsed electron beam irradiation

DSpace at IIT Bombay

View Archive Info
 
 
Field Value
 
Title Relaxation of operational amplifier parameters after pulsed electron beam irradiation
 
Creator BETTY, CA
GIRIJA, KG
LAL, R
 
Subject oxide-semiconductor capacitors
interface trap formation
low-dose rate
integrated-circuits
time-dependence
relaxation
operational amplifiers
pulsed irradiation
linac
time dependent phenomena
 
Description The relaxation of operational amplifier parameters (offset voltage and differential gain) with time after pulsed electron beam irradiation has been studied as a function of total dose and amplifier type. Four types of operational amplifiers were studied viz., general purpose bipolar input (mu A 741), super-beta transistor input (LM 308), JFET input (LF 356) and MOSFET input (CA 3140) from different vendors. The experiments were carried out mainly using 500 ns pulses from a Linear Accelerator. The study, the first of its kind, shows that while the electrical transient at the output of the operational amplifier recovers in a few milliseconds. relaxation of parameters can take several to several tens of seconds. This relaxation is attributed to the build up and/or anneal of damage in the oxide or at the interface of the internal transistor structures. The change and relaxation of parameters depend on operational amplifier type and total dose, and can have significant effects in certain application domains as illustrated by the response of a thermocouple amplifier after pulsed irradiation. (C) 1999 . .
 
Publisher PERGAMON-ELSEVIER SCIENCE LTD
 
Date 2011-08-26T07:02:29Z
2011-12-26T12:57:20Z
2011-12-27T05:47:26Z
2011-08-26T07:02:29Z
2011-12-26T12:57:20Z
2011-12-27T05:47:26Z
1999
 
Type Article
 
Identifier MICROELECTRONICS RELIABILITY, 39(10), 1485-1495
0026-2714
http://dx.doi.org/10.1016/S0026-2714(99)00090-6
http://dspace.library.iitb.ac.in/xmlui/handle/10054/11232
http://hdl.handle.net/10054/11232
 
Language en