Grain fragmentation and twinning in deformed Zircaloy 2: Response to positron lifetime measurements
DSpace at IIT Bombay
View Archive InfoField | Value | |
Title |
Grain fragmentation and twinning in deformed Zircaloy 2: Response to positron lifetime measurements
|
|
Creator |
SAHOO, SK
HIWARKAR, VD KRISHNA, KVM SAMAJDAR, I PANT, P PUJARI, PK DEY, GK SRIVASTAV, D TIWARI, R BANERJEE, S |
|
Subject |
energy dislocation-structures
annihilation techniques plastic-deformation defects plane microstructures spectroscopy orientation boundaries evolution positron tem ebsd zirconium defect dislocation grain fragmentation deformation twinning |
|
Description |
Microstructural developments in deformed Zircaloy 2 were studied using techniques ranging from positron annihilation spectroscopy (PAS), X-ray diffraction (XRD), transmission electron microscopy (TEM) and electron backscattered diffraction (EBSD). Grain fragmentation during plastic deformation, which is expected to involve dislocation realignment and recovery, showed a clear correlation with drop in mean PAS lifetime (tau(m)). An increased tau(m), on the other hand, was associated with annihilation of deformation twins. The deformation twins, (1 0 (1) over bar 2) type tensile twins, were identified from axis-angle relationship: 94.8 degrees ((1) over bar 2 (1) over bar 0). A deviation of more than 5 degrees from the exact twin orientation relationship was considered as annihilation. Such annihilation, caused by developments of in-grain misorientations, is expected to involve accommodation through interfacial dislocations. Presence of such dislocations, and associated point defects, offers an explanation for the observed increase in tau(m). (C) 2009
|
|
Publisher |
ELSEVIER SCIENCE SA
|
|
Date |
2011-07-27T23:43:34Z
2011-12-26T12:58:41Z 2011-12-27T05:49:04Z 2011-07-27T23:43:34Z 2011-12-26T12:58:41Z 2011-12-27T05:49:04Z 2010 |
|
Type |
Article
|
|
Identifier |
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 527(6), 1427-1435
0921-5093 http://dx.doi.org/10.1016/j.msea.2009.10.066 http://dspace.library.iitb.ac.in/xmlui/handle/10054/7352 http://hdl.handle.net/10054/7352 |
|
Language |
en
|
|