STRUCTURAL AND MORPHOLOGICAL-STUDIES OF ELECTRODEPOSITED AMORPHOUS-SILICON THIN-FILMS
DSpace at IIT Bombay
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Title |
STRUCTURAL AND MORPHOLOGICAL-STUDIES OF ELECTRODEPOSITED AMORPHOUS-SILICON THIN-FILMS
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Creator |
SARMA, PRL
MOHAN, TRR VENKATACHALAM, S SINGH, J SUNDERSINGH, VP |
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Subject |
solar-cell
sic-h microstructure spectroscopy efficiency spectra states |
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Description |
Amorphous silicon thin films obtained from hydrofluosilicic acid using the electrodeposition method are analysed for structure and morphology. The chemical nature of the films is discussed using the data from IR spectroscopy. The electrical resistivity of these films is very high, of the order of 10(12)-10(13) OMEGA cm, under the present experimental conditions. X-ray diffraction spectra revealed that the films are not crystalline in nature. At low concentrations of the electrolyte, scanning electron microscopy photographs exhibited some microstructure with crystalline order of about 100 angstrom, At high concentrations, the structure of the films changed widely to be homogeneous.
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Publisher |
ELSEVIER SCIENCE SA LAUSANNE
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Date |
2011-07-29T13:38:10Z
2011-12-26T12:48:44Z 2011-12-27T05:51:26Z 2011-07-29T13:38:10Z 2011-12-26T12:48:44Z 2011-12-27T05:51:26Z 1992 |
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Type |
Article
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Identifier |
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 15(3), 237-243
0921-5107 http://dx.doi.org/10.1016/0921-5107(92)90064-G http://dspace.library.iitb.ac.in/xmlui/handle/10054/7729 http://hdl.handle.net/10054/7729 |
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Language |
en
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