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STRUCTURAL AND MORPHOLOGICAL-STUDIES OF ELECTRODEPOSITED AMORPHOUS-SILICON THIN-FILMS

DSpace at IIT Bombay

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Title STRUCTURAL AND MORPHOLOGICAL-STUDIES OF ELECTRODEPOSITED AMORPHOUS-SILICON THIN-FILMS
 
Creator SARMA, PRL
MOHAN, TRR
VENKATACHALAM, S
SINGH, J
SUNDERSINGH, VP
 
Subject solar-cell
sic-h
microstructure
spectroscopy
efficiency
spectra
states
 
Description Amorphous silicon thin films obtained from hydrofluosilicic acid using the electrodeposition method are analysed for structure and morphology. The chemical nature of the films is discussed using the data from IR spectroscopy. The electrical resistivity of these films is very high, of the order of 10(12)-10(13) OMEGA cm, under the present experimental conditions. X-ray diffraction spectra revealed that the films are not crystalline in nature. At low concentrations of the electrolyte, scanning electron microscopy photographs exhibited some microstructure with crystalline order of about 100 angstrom, At high concentrations, the structure of the films changed widely to be homogeneous.
 
Publisher ELSEVIER SCIENCE SA LAUSANNE
 
Date 2011-07-29T13:38:10Z
2011-12-26T12:48:44Z
2011-12-27T05:51:26Z
2011-07-29T13:38:10Z
2011-12-26T12:48:44Z
2011-12-27T05:51:26Z
1992
 
Type Article
 
Identifier MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 15(3), 237-243
0921-5107
http://dx.doi.org/10.1016/0921-5107(92)90064-G
http://dspace.library.iitb.ac.in/xmlui/handle/10054/7729
http://hdl.handle.net/10054/7729
 
Language en