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Look-up table approach for RF circuit simulation using a novel measurement technique

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Title Look-up table approach for RF circuit simulation using a novel measurement technique
 
Creator AGARWAL, SN
JHA, ANURANJAN
VINAY KUMAR, D
VASI, J
PATIL, MB
RUSTAGI, SC
 
Subject mosfet
uhf amplifiers
uhf field effect transistors
circuit simulation
multiport networks
 
Description A simple and novel measurement technique to obtain three-port network-parameters of MOS transistors from two-port measurements on a single test structure is presented. The measured data is used in the form of a lookup table (LUT) for RF circuit simulation. It is shown that simulation results obtained with the LUT approach for a 2.4-GHz low-noise amplifier match very well with measurements, thus demonstrating the usefulness of the LUT approach. It is also shown that, for high frequencies, it is important to use the tables of y-parameters actually measured rather than those interpolated from low-frequency measurements. This is illustrated with a tuned amplifier simulation example.
 
Publisher IEEE
 
Date 2008-11-26T11:20:29Z
2011-11-25T16:07:46Z
2011-12-26T13:05:21Z
2011-12-27T05:52:07Z
2008-11-26T11:20:29Z
2011-11-25T16:07:46Z
2011-12-26T13:05:21Z
2011-12-27T05:52:07Z
2005
 
Type Article
 
Identifier IEEE Transactions on Electron Devices 52(5), 973-979
0018-9383
http://dx.doi.org/10.1109/TED.2005.846322
http://hdl.handle.net/10054/189
http://dspace.library.iitb.ac.in/xmlui/handle/10054/189
 
Language en_US