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Erratum to Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films

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Title Erratum to Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films
 
Creator VASA, PARINDA
SINGH, BP
TANEJA, PRAVEEN
AYYUB, PUSHAN
 
Subject interferometry
optical properties
absorption coefficients
nonlinear optical susceptibility
 
Description There is a critical need for a simple technique for the accurate measurement of weak optical nonlinearities such as the
nonlinear coefficients of thin films. We discuss the experimental set-up and provide a realistic analysis for a sensitive and
single beam technique based on an antiresonant ring interferometer for measuring nonlinear optical coefficients in thin
films. The technique was benchmarked using toluene and its superiority was demonstrated by measuring the effective
nonlinear absorption coefficient of a 1.3 μm thick CdS film, which could not be detected using standard techniques such
as z-scan. We show that this technique can, in principle, be used for films with thickness down to the nanometer.
 
Publisher Elsevier
 
Date 2009-04-03T09:03:31Z
2011-11-25T20:33:30Z
2011-12-26T13:08:09Z
2011-12-27T05:56:10Z
2009-04-03T09:03:31Z
2011-11-25T20:33:30Z
2011-12-26T13:08:09Z
2011-12-27T05:56:10Z
2004
 
Type Article
 
Identifier Optics Communications 237(4-6), 451
0030-4018
http://dx.doi.org/10.1016/j.optcom.2004.05.002
http://hdl.handle.net/10054/1114
http://dspace.library.iitb.ac.in/xmlui/handle/10054/1114
 
Language en