Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films
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Title |
Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films
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Creator |
VASA, PARINDA
SINGH, BP TANEJA, PRAVEEN AYYUB, PUSHAN |
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Subject |
cadmium sulfide
four wave mixing interferometry light absorption |
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Description |
There is a critical need for a simple technique for the accurate measurement of weak optical nonlinearities such as the nonlinear coefficients of thin films. We discuss the experimental set-up and provide a realistic analysis for a sensitive and single beam technique based on an antiresonant ring interferometer for measuring nonlinear optical coefficients in thin films. The technique was benchmarked using toluene and its superiority was demonstrated by measuring the effective nonlinear absorption coefficient of a 1.3 μm thick CdS film, which could not be detected using standard techniques such as z-scan. We show that this technique can, in principle, be used for films with thickness down to the nanometer regime.
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Publisher |
Elsevier
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Date |
2009-04-03T09:03:24Z
2011-11-25T20:33:00Z 2011-12-26T13:08:17Z 2011-12-27T05:56:17Z 2009-04-03T09:03:24Z 2011-11-25T20:33:00Z 2011-12-26T13:08:17Z 2011-12-27T05:56:17Z 2004 |
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Type |
Article
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Identifier |
Optics Communications 233(4-6), 297-304
0030-4018 http://dx.doi.org/10.1016/j.optcom.2004.01.051 http://hdl.handle.net/10054/1113 http://dspace.library.iitb.ac.in/xmlui/handle/10054/1113 |
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Language |
en
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