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Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films

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Title Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films
 
Creator VASA, PARINDA
SINGH, BP
TANEJA, PRAVEEN
AYYUB, PUSHAN
 
Subject cadmium sulfide
four wave mixing
interferometry
light absorption
 
Description There is a critical need for a simple technique for the accurate measurement of weak optical nonlinearities such as the nonlinear coefficients of thin films. We discuss the experimental set-up and provide a realistic analysis for a sensitive and single beam technique based on an antiresonant ring interferometer for measuring nonlinear optical coefficients in thin films. The technique was benchmarked using toluene and its superiority was demonstrated by measuring the effective nonlinear absorption coefficient of a 1.3 μm thick CdS film, which could not be detected using standard techniques such as z-scan. We show that this technique can, in principle, be used for films with thickness down to the nanometer regime.
 
Publisher Elsevier
 
Date 2009-04-03T09:03:24Z
2011-11-25T20:33:00Z
2011-12-26T13:08:17Z
2011-12-27T05:56:17Z
2009-04-03T09:03:24Z
2011-11-25T20:33:00Z
2011-12-26T13:08:17Z
2011-12-27T05:56:17Z
2004
 
Type Article
 
Identifier Optics Communications 233(4-6), 297-304
0030-4018
http://dx.doi.org/10.1016/j.optcom.2004.01.051
http://hdl.handle.net/10054/1113
http://dspace.library.iitb.ac.in/xmlui/handle/10054/1113
 
Language en