Record Details

Thickness dependent anomalous magnetic behavior in pulsed-laser deposited cobalt ferrite thin film

DSpace at IIT Bombay

View Archive Info
 
 
Field Value
 
Title Thickness dependent anomalous magnetic behavior in pulsed-laser deposited cobalt ferrite thin film
 
Creator SAHOO, SC
VENKATARAMANI, N
PRASAD, S
BOHRA, M
KRISHNAN, R
 
Subject CATION DISTRIBUTIONS
SPINEL COFE2O4
ANISOTROPY
TEMPERATURE
COERCIVITY
SUBSTRATE
PRESSURE
 
Description Cobalt ferrite thin films of different thicknesses were pulsed-laser deposited onto a fused quartz substrate held at ambient temperature (RT) by varying deposition time. The samples were ex-situ annealed at 750 degrees C in air for 2 hours. All the films were characterized by X-ray diffraction, Raman spectroscopy and energy dispersive X-ray analysis. The spontaneous magnetization, 4 pi M-S, was found to be 6130 G for the 50 nm thick sample, and this is higher than that for the bulk cobalt ferrite of 5300 G, by 16%. The 4 pi M-S was found to decrease with the increase in film thickness and an overall decrease of 32% was observed, when the film thickness increased from 50 nm to 600 nm. In contrast the films of the same thicknesses, when deposited at substrate temperature of 750 degrees C showed an increase of 4pMS with the increase in film thickness. The thickness dependence of 4 pi M-S in these nanocrystalline thin films has been explained in terms of the cation distribution and the grain size, which are sensitive to the substrate temperature during deposition.
 
Publisher SPRINGER
 
Date 2014-10-15T10:44:52Z
2014-10-15T10:44:52Z
2012
 
Type Article
 
Identifier APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 106(4)931-935
http://dx.doi.org/10.1007/s00339-011-6709-1
http://dspace.library.iitb.ac.in/jspui/handle/100/14778
 
Language en