Thickness dependent anomalous magnetic behavior in pulsed-laser deposited cobalt ferrite thin film
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Title |
Thickness dependent anomalous magnetic behavior in pulsed-laser deposited cobalt ferrite thin film
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Creator |
SAHOO, SC
VENKATARAMANI, N PRASAD, S BOHRA, M KRISHNAN, R |
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Subject |
CATION DISTRIBUTIONS
SPINEL COFE2O4 ANISOTROPY TEMPERATURE COERCIVITY SUBSTRATE PRESSURE |
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Description |
Cobalt ferrite thin films of different thicknesses were pulsed-laser deposited onto a fused quartz substrate held at ambient temperature (RT) by varying deposition time. The samples were ex-situ annealed at 750 degrees C in air for 2 hours. All the films were characterized by X-ray diffraction, Raman spectroscopy and energy dispersive X-ray analysis. The spontaneous magnetization, 4 pi M-S, was found to be 6130 G for the 50 nm thick sample, and this is higher than that for the bulk cobalt ferrite of 5300 G, by 16%. The 4 pi M-S was found to decrease with the increase in film thickness and an overall decrease of 32% was observed, when the film thickness increased from 50 nm to 600 nm. In contrast the films of the same thicknesses, when deposited at substrate temperature of 750 degrees C showed an increase of 4pMS with the increase in film thickness. The thickness dependence of 4 pi M-S in these nanocrystalline thin films has been explained in terms of the cation distribution and the grain size, which are sensitive to the substrate temperature during deposition.
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Publisher |
SPRINGER
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Date |
2014-10-15T10:44:52Z
2014-10-15T10:44:52Z 2012 |
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Type |
Article
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Identifier |
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 106(4)931-935
http://dx.doi.org/10.1007/s00339-011-6709-1 http://dspace.library.iitb.ac.in/jspui/handle/100/14778 |
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Language |
en
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