Record Details

Joining of Broken Multiwalled Carbon Nanotubes Using an Electron Beam-Induced Deposition (EBID) Technique

DSpace at IIT Bombay

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Field Value
 
Title Joining of Broken Multiwalled Carbon Nanotubes Using an Electron Beam-Induced Deposition (EBID) Technique
 
Creator DHALL, S
VAIDYA, G
JAGGI, N
 
Subject Functionalization
EBID technique
I-V characteristics
photolithography
BREAKDOWN
FUNCTIONALIZATION
 
Description In the present work, joining of broken multiwalled carbon nanotubes (MWCNTs) via an electron beam-induced deposition technique is discussed. Current-induced breakdown caused by Joule heating was achieved by applying an appropriate sweep voltage. Scanning electron microscopy images indicated physical joining of broken tubes. To confirm electrical joining of the tubes, current-voltage measurements of the same tube were carried out before and after joining. The current-voltage characteristics remained ohmic after joining of the broken tube. Furthermore, it was found that deposited platinum (Pt) forms ohmic contacts with different shells of MWCNTs after joining, whereas tungsten (W) does not. This approach provides a significant tool for repairing CNTs in interconnect technologies and assembly of three-dimensional (3D) nanostructures.
 
Publisher SPRINGER
 
Date 2014-12-28T13:03:57Z
2014-12-28T13:03:57Z
2014
 
Type Article
 
Identifier JOURNAL OF ELECTRONIC MATERIALS, 43(9)3283-3289
0361-5235
1543-186X
http://dx.doi.org/10.1007/s11664-014-3230-2
http://dspace.library.iitb.ac.in/jspui/handle/100/16655
 
Language English