Effects of high energy proton implantation on the optical and electrical properties of In(Ga)as/GaAs QD heterostructures with variations in the capping layer
DSpace at IIT Bombay
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Title |
Effects of high energy proton implantation on the optical and electrical properties of In(Ga)as/GaAs QD heterostructures with variations in the capping layer
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Creator |
UPADHYAY, S
MANDAL, A GHADI, H PAL, D BASU, A AGARWAL, A SUBRAHMANYAM, NBV SINGH, P CHAKRABARTI, S |
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Subject |
INAS/GAAS QUANTUM DOTS
INFRARED PHOTODETECTORS DARK CURRENT PHOTOLUMINESCENCE ENHANCEMENT EMISSION LASERS GAAS EFFICIENCY PL efficiency InAs/GaAs quantum dots Ion implantation Defect passivation |
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Description |
This study reports enhancements in photoluminescence (PL) efficiency resulting from implanting InAs/GaAs quantum dots with high energy protons without any post-annealing treatment and discusses the effects that result from varying the capping layer over dots. The PL efficiency for proton-implanted samples increased when the fluence of the 3 MeV protons improved from 8.0 x 10(11) to 1.0 x 10(13) ions/cm(2). Up to a certain point, variations in the proton energy level improved the PL efficiency. The improvements in PL efficiency resulted from annihilation of defects and non-radiative recombination centers from the dots and capping layer. Increments in the thermal activation energy of the implanted samples confirmed the finding. To determine the validity of the improvement on the optical properties of the dots, we implanted an InGaAs/GaAs quantum dot infrared photodetector (QDIP) heterostructure with 3 MeV protons. The implanted QDIP exhibited suppressed dark current density and enhanced peak detectivity by two orders compared to the as-grown devices. (C) 2015 Elsevier B.V. All rights reserved.
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Publisher |
ELSEVIER SCIENCE BV
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Date |
2016-01-14T14:25:14Z
2016-01-14T14:25:14Z 2015 |
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Type |
Article
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Identifier |
JOURNAL OF LUMINESCENCE, 161,129-134
0022-2313 1872-7883 http://dx.doi.org/10.1016/j.jlumin.2015.01.002 http://dspace.library.iitb.ac.in/jspui/handle/100/17721 |
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Language |
en
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