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Insight into the charge transport and degradation mechanisms in organic transistors operating at elevated temperatures in air

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Title Insight into the charge transport and degradation mechanisms in organic transistors operating at elevated temperatures in air
 
Creator NIGAM, A
KABRA, D
GARG, T
PREMARATNE, M
RAO, VR
 
Subject FIELD-EFFECT TRANSISTORS
THIN-FILM TRANSISTORS
LOW-VOLTAGE
PENTACENE
MOBILITY
STABILITY
ELECTRON
OFET
Pentacene
High temperature
Charge transport
Stability
 
Description Operational stability of organic devices at above-room-temperatures in ambient environment is of imminent practical importance. In this report, we have investigated the charge transport and degradation mechanisms in pentacene based organic field effect transistors (OFETs) operating in the temperatures ranging from 25 degrees C to 150 degrees C under ambient conditions. The thin film characterizations techniques (X-ray photoelectron spectroscopy, X-ray diffraction and atomic force microscopy) were used to establish the structural and chemical stability of pentacene thin films at temperatures up to 150 degrees C in ambient conditions. The electrical behavior of OFETs varies differently in different temperature bracket. Mobility, at temperatures below 110 degrees C, is found to be thermally activated in presence of traps and temperature independent in absence of traps. At temperatures above 110 degrees C mobility degrades due to polymorphism in pentacene or interfacial properties. The degradation of mobility is compensated with the decrease in threshold voltage at high temperatures and OFETs are operational at temperatures as high as 190 degrees C. 70 degrees C has been identified as the optimum temperature of operation for our OFETs where both device behavior and material properties are stable enough to ensure sustainable performance. (C) 2015 Elsevier B.V. All rights reserved.
 
Publisher ELSEVIER SCIENCE BV
 
Date 2016-01-15T04:52:33Z
2016-01-15T04:52:33Z
2015
 
Type Article
 
Identifier ORGANIC ELECTRONICS, 22,202-209
1566-1199
1878-5530
http://dx.doi.org/10.1016/j.orgel.2015.02.010
http://dspace.library.iitb.ac.in/jspui/handle/100/17805
 
Language en