Ion beam characterization and engineering of strain in semiconductor multilayers
Shodhganga@INFLIBNET
View Archive InfoField | Value | |
Title |
Ion beam characterization and engineering of strain in semiconductor multilayers
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Contributor |
Pathak, Anand P
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Description |
References p.154-155
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Date |
2011-04-06T09:53:35Z
2011-04-06T09:53:35Z 2011-04-06 27-12-2002 |
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Type |
Ph.D.
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Identifier |
http://hdl.handle.net/10603/1870
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Language |
English
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Rights |
university
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Format |
iii, 155p.
DVD |
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Publisher |
Hyderabad
University of Hyderabad School of Physics |
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Source |
INFLIBNET
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