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Ion beam characterization and engineering of strain in semiconductor multilayers

Shodhganga@INFLIBNET

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Field Value
 
Title Ion beam characterization and engineering of strain in semiconductor multilayers
 
Contributor Pathak, Anand P
 
Description References p.154-155
 
Date 2011-04-06T09:53:35Z
2011-04-06T09:53:35Z
2011-04-06
27-12-2002
 
Type Ph.D.
 
Identifier http://hdl.handle.net/10603/1870
 
Language English
 
Rights university
 
Format iii, 155p.
DVD
 
Publisher Hyderabad
University of Hyderabad
School of Physics
 
Source INFLIBNET