ICAR Research Data Repository for Knowledge Management
Statistical Design For Yield And Variability Optimization Of Analog Integrated Circuits
Electronic Theses of Indian Institute of Science
View Archive Info| Field | Value | |
| Title |
Statistical Design For Yield And Variability Optimization Of Analog Integrated Circuits
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| Creator |
Nalluri, Suresh Babu
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| Subject |
Integrated Circuits - Design and Construction
Analog Integrated Circuit Design Statistical MOS Model (SMOS) Response Surface Methodology (RSM) Statistical Simulation Electronic Engineering |
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| Contributor |
Shiva Prasad, A P
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| Date |
2011-05-13T10:21:22Z
2011-05-13T10:21:22Z 2011-05-13 2004-12 |
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| Type |
Thesis
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| Identifier |
http://etd.iisc.ernet.in/handle/2005/1198
http://etd.ncsi.iisc.ernet.in/abstracts/1558/G18903-Abs.pdf |
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| Language |
en_US
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| Relation |
G18903
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