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An algorithm to determine backscattering ratio and single scattering albedo

DRS at CSIR-National Institute of Oceanography

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Title An algorithm to determine backscattering ratio and single scattering albedo
 
Creator Suresh, T.
Desa, E.
Matondkar, S.G.P.
Mascarenhas, A.A.M.Q.
Nayak, S.R.
Naik, P.
 
Subject scattering albedo
back scattering ratio
 
Description Algorithms to determine the inherent optical properties of water, backscattering probability and single scattering albedo at 490 and 676 nm from the apparent optical property, remote sensing reflectance are presented here. The measured scattering and backscattering coefficients and the remote sensing reflectance are used to obtain a relationship for the backscattering ratio, which is defined as the ratio of the total backscattering to the total scattering in terms of the remote sensing reflectance of two bands. Using the empirical relationship for the total backscattering ratios, we have also computed single scattering albedo, which is defined as the ratio of the scattering to the beam attenuation coefficient. The values of single scattering albedo obtained from measured values and those obtained from the empirical method are found to be comparable. The values of single scattering albedo derived using the algorithm are found to be comparable to the measured values obtained from the eastern Arabian Sea, with the root mean squared error of 0.078 and the mean percentage error of 9.5 % for the 490 nm and root mean squared error of 0.043 and the mean percentage error of 7.5 % for the 676 nm
 
Date 2007-03-07T09:46:50Z
2007-03-07T09:46:50Z
2006
 
Type Journal Article
 
Identifier Proceedings of SPIE, vol.6404, 640414
http://drs.nio.org/drs/handle/2264/544
 
Language en
 
Rights Copyright 2006 Society of Photo-Optical Instrumentation Engineers.
This paper was (will be) published in [Proc. of SPIE Vol. 6404, 640414] and is made available as an electronic reprint (preprint) with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
 
Format 214724 bytes
application/pdf
 
Publisher Society of Photo-Optical Instrumentation Engineers