Proton NMR transverse relaxation time and membrane stability in wheat leaves exposed to high temperature shock
NOPR - NISCAIR Online Periodicals Repository
View Archive InfoField | Value | |
Title |
Proton NMR transverse relaxation time and membrane stability in wheat leaves exposed to high temperature shock
|
|
Creator |
Nagarajan, Shantha
Joshi, D K Anand, Anjali Verma, A P S Pathak, P C |
|
Subject |
NMR transverse relaxation time
Wheat leaves Membrane stability High temperature shock Electrolyte leakage Heat tolerant Heat susceptible |
|
Description |
122-126
Electrolyte leakage from leaves and NMR transverse relaxation time (T₂) of leaf water were used to differentiate between heat-tolerant (NIAW 845) and susceptible (HD 2428) wheat (Triticum aestivum L.) cultivars. The leaves were exposed to high temperature shock in the range 30 to 55ºC and the damage caused, when evaluated by the two approaches was in close agreement. The critical temperature of injury leading to loss of membrane integrity was lower (39.1ºC) for susceptible cultivar, compared to tolerant cultivar (44.2ºC). Component analyses of NMR data revealed the existence of two fractions of cellular water in leaf tissues, namely, bound and free bulk water with distinct relaxation times. A dramatic reduction in the proportion of free water and a corresponding increase in bound water was observed in response to increase in temperature. This change in proportion occurred around 38ºC and 43ºC in HD 2428 and NIAW 845 respectively. The high temperature induced irreversible damage to cellular membrane integrity led to loss of compartmentation of cellular water fractions. The tolerant cultivar maintained its membrane integrity and cell water compartmentation until a temperature of 43ºC and susceptible could maintain it only until 38ºC. |
|
Date |
2009-03-30T07:19:48Z
2009-03-30T07:19:48Z 2005-04 |
|
Type |
Article
|
|
Identifier |
0301-1208
http://hdl.handle.net/123456789/3507 |
|
Language |
en_US
|
|
Relation |
G01N 27/40
|
|
Publisher |
CSIR
|
|
Source |
IJBB Vol.42(2) [April 2005]
|
|