ICAR Research Data Repository for Knowledge Management
An automated IC chip marking inspection system for surface mounted devices on taping machines
NOPR - NISCAIR Online Periodicals Repository
View Archive Info| Field | Value | |
| Title |
An automated IC chip marking inspection system for surface mounted devices on taping machines
|
|
| Creator |
Chen, Shih-Hung
Liao, Te-Tan |
|
| Subject |
Learning vector quantization
On-line inspection Surface mounted device |
|
| Description |
361-366
This study presents a new automated system for inspecting markings on surface mounted devices (SMDs) prior to packaging. In proposed design, marking region is identified using a normalized cross-correlation template-matching scheme. A multiresolution pyramid image processing approach is used to enhance speed of search process. Target image is filtered using a hybrid digital logic filter (DLC) / mean and standard deviation gray scale (MSDGS) algorithm for noise filtering. Individual characters in marking are segmented and fed to a neural network for automatic recognition. DLC / MSDGS filtering scheme is found more straightforward and far more robust toward a noise filtering than conventional image processing schemes. System achieves a recognition rate of 99.14% with identifying each IC chip marking within 0.05 sec. System provides an ideal solution for real-time inspection of IC markings in high-throughput SMD packaging applications. |
|
| Date |
2009-04-13T04:01:38Z
2009-04-13T04:01:38Z 2009-05 |
|
| Type |
Article
|
|
| Identifier |
0022-4456
http://hdl.handle.net/123456789/3786 |
|
| Language |
en_US
|
|
| Publisher |
CSIR
|
|
| Source |
JSIR Vol.68(05) [May 2009]
|
|