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<strong>Measurement of g-ray transmission factors of semiconductor crystals at various annealing temperature and time</strong>

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Title Statement <strong>Measurement of g-ray transmission factors of semiconductor crystals at various annealing temperature and time</strong>
 
Added Entry - Uncontrolled Name AKCA, BURCU ; Atatürk Universty
 
Uncontrolled Index Term atomic and molecular physics; solid state physics
Transmission factors; EDXRF; Crystal growth; InSe; Semiconductor single crystals; Bridgman/Stockbarger technique; XRD
 
Summary, etc. In the present study,<strong> </strong>the change according to the annealing temperature and time of g-ray transmission factors or transmissivity of InSe, InSe:Sn semiconductor crystals that prepared by not evaporated onto the stage (glass) and InSe, InSe:Mn, InSe:Fe, InSe:Ag, InSe:Cd, InSe:Sn and InSe:Gd semiconductor crystals that prepared by evaporated onto the stage (glass), have been examined. Gamma-rays of <sup>241</sup>Am passed through crystals have been detected by a high-resolution Si(Li) detector and by using energy dispersive X-ray fluorescence spectrometer (EDXRF). Undoped-InSe and Mn, Fe, Ag, Cd, Sn, Gd doped InSe semiconductor crystals have been grown by using the Bridgman/Stockbarger. Evaporated onto the stage crystals have been prepared by using thin-film coatings system with thermal evaporation method. The structural and lattice parameters of the InSe and InSe:Sn semiconductors have been analyzed by using X-ray diffractometer (XRD). Transmission factors have been given graphically against the <span lang="&quot;EN-NZ&quot;">annealing temperature and time for time range 0 (unannealed)-60 min with a step of 10 min. Also, transmission factors have been measured for <span style="&quot;mso-ansi-language: EN-NZ&quot;;" lang="&quot;EN-NZ&quot;">annealing temperature range 50-(combustion temperature of the crystal) with a step of 50<span style="&quot;font-family: Symbol; mso-ascii-font-family: &quot;;" lang="&quot;EN-GB&quot;">°C for not evaporated onto the stage semiconductor crystals. Transmission factors have been measured for <span style="&quot;mso-ansi-language: EN-NZ&quot;;" lang="&quot;EN-NZ&quot;">annealing temperature range 60<span style="&quot;font-family: Symbol;" lang="&quot;EN-GB&quot;">°C-(cracking temperature of the stage) with a step of 60<span style="&quot;font-family: Symbol;" lang="&quot;EN-GB&quot;">°C for evaporated onto the stage crystals. Results are presented and discussed in the present paper. </span></span></span></span></span></span><p> </p>
 
Publication, Distribution, Etc. Indian Journal of Pure & Applied Physics (IJPAP)
2015-04-27 15:04:26
 
Electronic Location and Access http://op.niscair.res.in/index.php/IJPAP/article/view/5627
 
Data Source Entry Indian Journal of Pure & Applied Physics (IJPAP); ##issue.vol## 53, ##issue.no## 1 (2015): Indian Journal of Pure & Applied Physics
 
Language Note en
 
Nonspecific Relationship Entry http://op.niscair.res.in/index.php/IJPAP/article/download/5627/13349
 
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