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<strong>Characterization of zincblende CuInS2 nanostructured film: The XRD, Raman, FT-IR and UV-vis spectroscopical investigations</strong>

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Title Statement <strong>Characterization of zincblende CuInS2 nanostructured film: The XRD, Raman, FT-IR and UV-vis spectroscopical investigations</strong>
 
Added Entry - Uncontrolled Name Hurma, Tülay ; Anadolu University Department of Physics
 
Uncontrolled Index Term specific instrumentation and techniques of general use in physics
Zincblende CuInS2 film; XRD; Raman; FTIR; Optical Properties
 
Summary, etc. Zincblende semiconductor CuInS<sub>2</sub> has not been focus of studies until recently. Ultrasonic spray pyrolysis (USP) method is used to deposit zincblende CuInS<sub>2</sub> nanostructured film on glass substrate at 250 °C in this study. The film was characterized by vibrational (FT-IR and Raman) spectroscopy, X-ray diffraction (XRD), scanning electron microscopy (SEM) and UV-vis spectra. The crystallite size was calculated to be around 30 nm by using the well- known Scherrer equation with the peak corresponding to (111) plane. The Raman peak at 306 cm<sup>-1</sup> is assigned to the A<sub>1</sub> mode of the CuAu-ordered CuInS<sub>2</sub>. Thus, metastable cubic zincblende structure would be evidenced. The absorption coefficient of the film has been found to be in the order of 10<sup>4</sup>-10<sup>5 </sup>cm<sup>−1</sup>, which make it promising for an intensive optoelectronic application.
 
Publication, Distribution, Etc. Indian Journal of Pure & Applied Physics (IJPAP)
2016-12-27 09:11:23
 
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http://op.niscair.res.in/index.php/IJPAP/article/view/12276
 
Data Source Entry Indian Journal of Pure & Applied Physics (IJPAP); ##issue.vol## 54, ##issue.no## 12 (2016): Indian Journal of Pure & Applied Physics
 
Language Note en
 
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