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<strong>Microwave device jig characterization for ferromagnetic resonance induced spin Hall effect measurement in bilayer thin films</strong>

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Title Statement <strong>Microwave device jig characterization for ferromagnetic resonance induced spin Hall effect measurement in bilayer thin films</strong>
 
Added Entry - Uncontrolled Name AHMAD, SAOOD ; National Physical Laboratory
CSIR-NPL
 
Uncontrolled Index Term Applied Physics
Microwave magnetics, Spin Hall effect, Ferromagnetic resonance
 
Summary, etc. Microwave device jig for evaluating magnetic thin films consists of two symmetrical radial copper pad sections each having panel mounted <em>RF</em> connector. A non resonant measurement method for obtaining spin Hall voltage across magnetic thin films using ferromagnetic resonance was developed, based on electrical impedance of thin film and copper pads of the microwave device jig both in contact with each other. A geometry is introduced, which provides good impedance match characteristics and is optimised for maximum power transmission. It also gives the flexibility in measurements for any orientation of thin film with respect to applied magnetic field. In this geometry, a quantitative study of the microwave device jig has been done by measuring spin Hall voltages in the frequency range 0.1-10 GHz for bilayer thin films. The experimentally recorded voltages can be fully ascribed to SHE detection due to microwave induced FMR.
 
Publication, Distribution, Etc. Indian Journal of Pure & Applied Physics (IJPAP)
2016-01-11 09:49:15
 
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http://op.niscair.res.in/index.php/IJPAP/article/view/9104
 
Data Source Entry Indian Journal of Pure & Applied Physics (IJPAP); ##issue.vol## 54, ##issue.no## 01 (2016): Indian Journal of Pure & Applied Physics
 
Language Note en
 
Nonspecific Relationship Entry http://op.niscair.res.in/index.php/IJPAP/article/download/9104/25117
 
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