<strong>Improved surface properties of PTFE polymer films using broad ion source</strong>
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dc |
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Title Statement |
<strong>Improved surface properties of PTFE polymer films using broad ion source</strong> |
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Added Entry - Uncontrolled Name |
atta, ali ; Supplementary Files |
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Uncontrolled Index Term |
PTFE; Ion Beam; SRIM; Structural; optical; Electrical properties |
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Summary, etc. |
The main objective of this paper is to improve the surface properties of the polytetrafluoroethylene (PTFE) polymer films by ion beam irradiation with 2 keV Ar<sup>+ </sup>energy and various ion fluence ranging from 1×10<sup>17</sup> to 3×10<sup>17</sup> ions/cm<sup>2</sup>. Various characterization techniques, namely, X-ray diffraction (XRD), UV-Vis spectroscopy and electrical measurements have been used to confirm these changes. XRD measurement shows the decrease of the XRD peak intensity and reflects some loss of crystallinity after irradiation. The UV-Vis has shown a shift of the absorption edge of irradiated samples towards the visible region. The band gap energy <em>E<sub>g</sub></em> was calculated using Tauc’s relation, and its value decreases with an increase of ion fluence for all irradiated samples. Increasing ion fluence leads to slight increase in electrical conductivities (σ<sub>dc </sub>and σ<sub>ac</sub>) and dielectric loss ε<sub>2</sub> for PTFE samples. |
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Publication, Distribution, Etc. |
Indian Journal of Pure & Applied Physics (IJPAP) 2016-09-22 14:14:31 |
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Electronic Location and Access |
application/force-download http://op.niscair.res.in/index.php/IJPAP/article/view/12101 |
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Data Source Entry |
Indian Journal of Pure & Applied Physics (IJPAP); ##issue.vol## 54, ##issue.no## 9 (2016): Indian Journal of Pure & Applied Physics |
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Language Note |
en |
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Terms Governing Use and Reproduction Note |
Except where otherwise noted, the Articles on this site are licensed under Creative Commons License: CC Attribution-Noncommercial-No Derivative Works 2.5 India © 2015. The Council of Scientific & Industrial Research, New Delhi. |
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