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<strong>Investigation of Cu2ZnSnS4 thin film by scanning Kelvin force microscopy</strong>

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Title Statement <strong>Investigation of Cu2ZnSnS4 thin film by scanning Kelvin force microscopy</strong>
 
Added Entry - Uncontrolled Name Singh, Vidya Nand; CSIR-NPL Delhi
 
Uncontrolled Index Term experimental solid state physics, techniques
CZTS, sputtering; sulfurization using H2S; C-AFM; structural properties
 
Summary, etc. CZTS thin film has been grown on Mo-coated soda lime glass by co-sputtering the metal targets and post sulfurization in H<sub>2</sub>S ambient. The structural, microstructural, compositional and optical properties have been studied using glancing incidence XRD, Raman spectroscopy, SEM, EDS, XRF and UV-Vis spectrophotometry. Local electrical transport measurements using conducting AFM show that for small bias voltage (-0.5 V), the dark negative currents flow mainly through grain boundaries (GBs) rather than grain interior. Kelvin probe force microscopic measurements (local surface potential) indicated positive surface potential in the vicinity of GBs in a Cu-deficient CZTS thin film. All measurements indicated that grain interior to GBs have a smaller effective band gap than the bulk, due to the composition change (Cu-vacancies or Cu<sub>Zn</sub> anti site defects) at GBs. Electrical measurement revealed the presence of defects in the CZTS thin film.
 
Publication, Distribution, Etc. Indian Journal of Pure & Applied Physics (IJPAP)
2015-10-07 09:24:25
 
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http://op.niscair.res.in/index.php/IJPAP/article/view/7371
 
Data Source Entry Indian Journal of Pure & Applied Physics (IJPAP); ##issue.vol## 53, ##issue.no## 10 (2015): Indian Journal of Pure & Applied Physics
 
Language Note en
 
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