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<strong>Accelerated life test of white OLED based on lognormal distribution</strong>

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Title Statement <strong>Accelerated life test of white OLED based on lognormal distribution</strong>
 
Added Entry - Uncontrolled Name Zhang, Jianping ; Shanghai University of Electric Power
Cheng, Guoliang
Chen, Xiao
Han, Yi
Zhou, Tingjun
Qiu, Yingji
 
Uncontrolled Index Term reliability analysis, life prediction
White organic light emitting diode; Accelerated life test; Lognormal distribution; Least square method
 
Summary, etc. <strong>In order to acquire the life information of white organic light-emitting diode (WOLED), an accelerated life test (ALT) model was established with increased working current. The lognormal distribution was applied to describe the life distribution, while the least square method (LSM) was employed to estimate the logarithm mean value and the logarithm standard deviation. Statistics and analysis on constant stress and step stress test data were performed by using the self-developed software. The numerical results show that the WOLED life is consistent with lognormal distribution and the accelerated model meets the inverse power law. The key acceleration parameter, which was calculated accurately, enables a rapid estimation of WOLED life.</strong>
 
Publication, Distribution, Etc. Indian Journal of Pure & Applied Physics (IJPAP)
2015-06-22 13:48:30
 
Electronic Location and Access application/pdf
http://op.niscair.res.in/index.php/IJPAP/article/view/2446
 
Data Source Entry Indian Journal of Pure & Applied Physics (IJPAP); ##issue.vol## 52, ##issue.no## 10 (2014): Indian Journal of Pure & Applied Physics
 
Language Note en
 
Nonspecific Relationship Entry http://op.niscair.res.in/index.php/IJPAP/article/download/2446/4046
 
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